Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis


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Oct. 18, 2021, 7:46 a.m.

Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis

Jong T.A. de, Kok, D.N.L, Torren A.J.H. van der, Schopmans H., Tromp R.M., Molen S.J. van der & Jobst J.
Jong T.A. de, Kok, D.N.L, Torren A.J.H. van der, Schopmans H., Tromp R.M., Molen S.J. van der & Jobst J. (2019), Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis, Ultramicroscopy .
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Why should we reproduce your paper?
Low Energy Electron Microscopy (LEEM) is a somewhat specific form of electron microscopy used to study surfaces and 2D materials. In this paper we describe a set of data processing techniques applied to LEEM and adapted to the peculiarities of LEEM. This is combined with a parallelized Python implementation using Dask in separate notebooks. So if you are interested in microscopy, image analysis, clustering of experimental physics data or parallel Python, this paper should be interesting to you.
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